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Sponsored by the Insulated Conductors Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 5 June 2012 IEEE Power & Energy Society IEEE Std 400™-2012 (Revision of IEEE Std 400-2001) IEEE Guide for Field Testing and Evaluation of the Insulation of Shielded Power Cable Systems Rated 5 kV and Above Authorized licensed use limited to: Universidad Tecnica Federico Santa Maria. Downloaded on December 05,2012 at 22:36:54 UTC from IEEE Xplore. Restricti
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    Sponsored by the Insulated Conductors Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 5 June 2012 IEEE Power & Energy Society IEEE Std 4 ™ -2  12 (Revision of IEEE Std 400-2001) IEEE Guide for Field Testing and Evaluation of the Insulation of Shielded Power Cable Systems Rated 5 kV and Above Authorized licensed use limited to: Universidad Tecnica Federico Santa Maria. Downloaded on December 05,2012 at 22:36:54 UTC from IEEE Xplore. Restrictions apply.  Authorized licensed use limited to: Universidad Tecnica Federico Santa Maria. Downloaded on December 05,2012 at 22:36:54 UTC from IEEE Xplore. Restrictions apply.  IEEE Std 400™-2012 (Revision of IEEE Std 400-2001) IEEE Guide for Field Testing and Evaluation of the Insulation of Shielded Power Cable Systems Rated 5 kV and Above Sponsor Insulated Conductors Committee of the IEEE Power & Energy Society  Approved 29 March 2012 IEEE-SA Standards Board Authorized licensed use limited to: Universidad Tecnica Federico Santa Maria. Downloaded on December 05,2012 at 22:36:54 UTC from IEEE Xplore. Restrictions apply.    Abstract:  Various field test methods that are currently available or under development are listed in this guide. The guide covers shielded, insulated power cable systems rated 5 kV and above. The guide describes the tests and gives advantages and disadvantages, suggested applications, and typical results. Complete guides covering some of the test methods listed are available in the form of IEEE 400 “point” documents. Keywords:  field testing, IEEE 400, power cable system The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright © 2012 by the Institute of Electrical and Electronics Engineers, Inc.  All rights reserved. Published 5 June 2012. Printed in the United States of America. IEEE, National Electrical Safety Code, and NESC are registered trademarks in the U.S. Patent & Trademark Office, owned by the Institute of Electrical and Electronics Engineers, Incorporated. PDF: ISBN 978-0-7381-7266-8 STD97241 Print: ISBN 978-0-7381-7372-6 STDPD97241 IEEE prohibits discrimination, harassment, and bullying. For more information, visit http://www.ieee.org/web/aboutus/whatis/policies/p9-26.html  .   No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. Authorized licensed use limited to: Universidad Tecnica Federico Santa Maria. Downloaded on December 05,2012 at 22:36:54 UTC from IEEE Xplore. Restrictions apply.
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